发明名称 Lens-free imaging system and method for detecting particles in sample deposited on image sensor
摘要 A lens-free imaging system for detecting particles in a sample deposited on image sensor includes a fluidic chamber for holding a sample and an image sensor for imaging the sample, wherein the image sensor has a light receiving surface and a plurality of photosensitive pixels disposed underneath the light receiving surface, and wherein the fluidic chamber formed at least in part by the light receiving surface. A method for detecting particles of interest in a sample deposited on an image sensor, through lens-free imaging using the image sensor, includes (ii) generating an image of the sample, deposited on a light receiving surface of the image sensor, by illuminating the sample, and (ii) detecting the particles of interest in the image.
申请公布号 US9574989(B2) 申请公布日期 2017.02.21
申请号 US201414455182 申请日期 2014.08.08
申请人 OmniVision Technologies, Inc. 发明人 Lei Junzhao
分类号 G01N21/00;G01N15/14;G01N21/64;G01N15/00;G01N15/10 主分类号 G01N21/00
代理机构 Lathrop & Gage LLP 代理人 Lathrop & Gage LLP
主权项 1. A lens-free imaging system for detecting particles in a sample deposited on image sensor, comprising: a fluidic chamber for holding a sample and an image sensor for imaging the sample, the image sensor having a light receiving surface and a plurality of photosensitive pixels disposed underneath the light receiving surface, the fluidic chamber formed at least in part by the light receiving surface; and a light source for illuminating the sample to form a shadow image of the sample on at least a portion of the plurality of photosensitive pixels, the light receiving surface being at least partially transmissive to light emitted by the light source, the shadow image including shadows formed by particles in the sample that block at least a portion of the light, distance from the light receiving surface to the plurality of photosensitive pixels, size of particles of interest, and wavelength of the light being such that particles of interest in the sample are identifiable in the shadow image using size-selection criteria.
地址 Santa Clara CA US