发明名称 Magnetoresistance effect element and magnetic memory
摘要 A magnetoresistance effect element and a magnetic memory having thermal stability expressed by a thermal stability factor of 70 or more even with a fine junction size. The magnetoresistance effect element includes a first magnetic layer of an invariable magnetization direction forming a reference layer, a second magnetic layer of a variable magnetization direction forming a recording layer, and a first non-magnetic layer disposed between the first and second magnetic layers in a thickness direction of the first and second magnetic layers. At least one of the first and second magnetic layers has the following relationship between D (nm) and t (nm): D<0.9t+13, where D is a junction size corresponding to the length of a longest straight line on an end surface perpendicular to the thickness direction, and t is a layer thickness. The junction size is 30 nm or less.
申请公布号 US9577182(B2) 申请公布日期 2017.02.21
申请号 US201415029860 申请日期 2014.10.20
申请人 TOHOKU UNIVERSITY 发明人 Ikeda Shoji;Sato Hideo;Fukami Shunsuke;Yamanouchi Michihiko;Matsukura Fumihiro;Ohno Hideo;Ishikawa Shinya
分类号 H01L43/08;G11C11/16;H01L43/02;H01L27/22 主分类号 H01L43/08
代理机构 Oliff PLC 代理人 Oliff PLC
主权项 1. A magnetoresistance effect element comprising a first magnetic layer of a fixed magnetization direction that is either an upward direction or a downward direction in a thickness direction, a second magnetic layer of a variable magnetization direction that can be varied upwardly or downwardly in a thickness direction, and a first non-magnetic layer disposed between the first and second magnetic layers in a thickness direction of the first and second magnetic layers, wherein the second magnetic layer has the following relationship between D (nm) and t (nm): D<0.9t+13, where D is a junction size corresponding to the length of a longest straight line on an end surface perpendicular to the thickness direction, and t is its layer thickness.
地址 Sendai-shi JP