发明名称 Semiconductor structure and semiconductor fabricating process for the same
摘要 A semiconductor structure and a fabricating process for the same are provided. The semiconductor fabricating process includes providing a first dielectric layer, a transitional layer formed on the first dielectric layer, and a conductive fill penetrated through the transitional layer and into the first dielectric layer; removing the transitional layer; and forming a second dielectric layer over the conductive fill and the first dielectric layer.
申请公布号 US9576893(B2) 申请公布日期 2017.02.21
申请号 US201414559660 申请日期 2014.12.03
申请人 Taiwan Semiconductor Manufacturing Company, Ltd. 发明人 Huang Tsung-Min;Lee Chung-Ju
分类号 H01L21/283;H01L23/48;H01L23/485;H01L23/522;H01L21/768;H01L23/532 主分类号 H01L21/283
代理机构 Slater Matsil, LLP 代理人 Slater Matsil, LLP
主权项 1. A structure comprising: a first dielectric layer; an opening in the first dielectric layer; a first conductive feature, wherein an entirety of top surfaces of the first conductive feature is higher than the first dielectric layer, and the first conductive feature comprising: a first portion in the opening, wherein the first portion of the first conductive feature contacts sidewalls of the first dielectric layer, with the sidewalls facing the opening; anda second portion over the first dielectric layer, with the second portion having a first edge; a second conductive feature over the first conductive feature, wherein the first and the second conductive features are formed of different materials, and the second conductive feature comprises a second edge aligned with the first edge; and a barrier layer along the second edge of the second conductive feature.
地址 Hsin-Chu TW