发明名称 |
Semiconductor structure and semiconductor fabricating process for the same |
摘要 |
A semiconductor structure and a fabricating process for the same are provided. The semiconductor fabricating process includes providing a first dielectric layer, a transitional layer formed on the first dielectric layer, and a conductive fill penetrated through the transitional layer and into the first dielectric layer; removing the transitional layer; and forming a second dielectric layer over the conductive fill and the first dielectric layer. |
申请公布号 |
US9576893(B2) |
申请公布日期 |
2017.02.21 |
申请号 |
US201414559660 |
申请日期 |
2014.12.03 |
申请人 |
Taiwan Semiconductor Manufacturing Company, Ltd. |
发明人 |
Huang Tsung-Min;Lee Chung-Ju |
分类号 |
H01L21/283;H01L23/48;H01L23/485;H01L23/522;H01L21/768;H01L23/532 |
主分类号 |
H01L21/283 |
代理机构 |
Slater Matsil, LLP |
代理人 |
Slater Matsil, LLP |
主权项 |
1. A structure comprising:
a first dielectric layer; an opening in the first dielectric layer; a first conductive feature, wherein an entirety of top surfaces of the first conductive feature is higher than the first dielectric layer, and the first conductive feature comprising:
a first portion in the opening, wherein the first portion of the first conductive feature contacts sidewalls of the first dielectric layer, with the sidewalls facing the opening; anda second portion over the first dielectric layer, with the second portion having a first edge; a second conductive feature over the first conductive feature, wherein the first and the second conductive features are formed of different materials, and the second conductive feature comprises a second edge aligned with the first edge; and a barrier layer along the second edge of the second conductive feature. |
地址 |
Hsin-Chu TW |