Automated low cost method for illuminating, evaluating, and qualifying surfaces and surface coatings

摘要

Systems and methods for inspecting a surface are disclosed. A source, detector, a base, a controller, and a processing device are used to collect image data related to the surface and information relating to the location of the image data on the surface. The image data and information relating to location are correlated and stored in a processing device to create a map of surface condition.

主权项

1. An inspection system comprising:
a source including visible light lamps selected to produce a spectrum of light that enables the observation of mottling due to an irregular mixture of mica, wherein the spectrum of light is AM1.5 full spectrum light; a detector; a base for positioning at least one of the source or detector; a controller in communication with at least the base to communicate location control information to the base to enable control of a location of at least one of the source or detector; and a processor device for collecting image data from the detector and storing the image data in a manner that correlates the image data with information related to the location of at least one of the source or detector, the processor device storing reference data to enable evaluation of the image data by comparing a property of the image data to the stored reference data.