发明名称 |
Semiconductor device and method of manufacturing the same |
摘要 |
Disclosed is a semiconductor device, including: stack structures including interlayer insulating patterns and conductive line patterns, which are alternately stacked, and separated by a first slit; string pillars passing through the stack structures; and dummy holes passing through top portions of the stack structures to be spaced apart from bottom surface of the stack structures and disposed between the string pillars. |
申请公布号 |
US9576973(B2) |
申请公布日期 |
2017.02.21 |
申请号 |
US201514821445 |
申请日期 |
2015.08.07 |
申请人 |
SK Hynix Inc. |
发明人 |
Lee Hyun Ho;Kim Jong Man |
分类号 |
H01L29/792;H01L27/115;H01L21/28;H01L23/528;H01L23/532;H01L21/768 |
主分类号 |
H01L29/792 |
代理机构 |
IP & T Group LLP |
代理人 |
IP & T Group LLP |
主权项 |
1. A semiconductor device, comprising:
stack structures including interlayer insulating patterns and conductive line patterns, which are alternately stacked; a first slit between the stack structures; string pillars passing through the stack structures; and dummy holes passing through top portions of the stack structures to be spaced apart from bottom surface of the stack structures and disposed between the string pillars, wherein each of the dummy holes is filled with a filling material different from materials of structures of the string pillars, and wherein each of the conductive line patterns includes:
a first conductive pattern formed in a line pattern area between two interlayer insulating patterns, which are arranged adjacent to each other in the vertical direction, and formed along surfaces of the interlayer insulating patterns and the string pillars;a second conductive pattern provided in the line pattern area and provided over the first conductive pattern; anda non-conductive pattern provided in the line pattern area, provided between each of the string pillars and the first conductive pattern, and surrounded by the first conductive pattern. |
地址 |
Gyeonggi-do KR |