发明名称 Illumination system for a microlithographic projection exposure apparatus
摘要 Illumination systems for microlithographic projection exposure apparatus, as well as related systems, components and methods are disclosed. In some embodiments, an illumination system includes one or more scattering structures and an optical integrator that produces a plurality of secondary light sources.
申请公布号 US9575414(B2) 申请公布日期 2017.02.21
申请号 US201514946284 申请日期 2015.11.19
申请人 Carl Zeiss SMT GmbH 发明人 Wangler Johannes;Siekmann Heiko;Weible Kenneth;Scharnweber Ralf;Maul Manfred;Deguenther Markus;Layh Michael;Scholz Axel;Spengler Uwe;Voelkel Reinhard
分类号 G02B27/10;G03B27/54;G03B27/72;G03F7/20;G02B3/00;G02B27/09 主分类号 G02B27/10
代理机构 Fish & Richardson P.C. 代理人 Fish & Richardson P.C.
主权项 1. An optical system, comprising: an optical integrator configured so that, when light is incident thereon, the optical integrator produces secondary light sources; a first scattering structure arranged, along a light propagation direction of the system, in front of the optical integrator, the first scattering structure comprising first subelements configured to introduces a divergence of incident light only in one direction; and a second scattering structure arranged, along a light propagation direction of the system, behind the optical integrator, the second scattering structure comprising second subelements configured to introduce a divergence of incident light in two directions, wherein the system is a microlithographic illumination system.
地址 Oberkochen DE