发明名称 Slide scanner with dynamic focus and specimen tilt and method of operation
摘要 An instrument and method for scanning large microscope specimen on a specimen holder has a scanning optical microscope that is configured to scan the specimen in one of brightfield and fluorescence. The specimen is dynamically tillable about a scan direction during a scan to maintain focus along the length of each scan line as the scan proceeds. A three dimensional image of the specimen can be obtained wherein the specimen tilt and relative focus are maintained from a first image contour to a second image contour through a thickness of a specimen.
申请公布号 US9575308(B2) 申请公布日期 2017.02.21
申请号 US201314387457 申请日期 2013.03.21
申请人 Huron Technologies International Inc. 发明人 Dixon Arthur Edward;Damaskinos Savvas
分类号 G02B21/36;G02B21/26;G02B21/00;G02B21/12;G02B21/16 主分类号 G02B21/36
代理机构 代理人 Schnurr Daryl W.
主权项 1. An instrument for scanning a large microscope specimen on a specimen holder, the instrument comprising a scanning optical microscope that is configured to scan the specimen in one of brightfield and fluorescence, the specimen being dynamically tiltable about a scan direction during a scan to maintain focus along a length of each scan line as the scan proceeds, a two dimensional detector array receiving data from the scan using Moving Specimen Image Averaging.
地址 Waterloo, ON CA