发明名称 |
Slide scanner with dynamic focus and specimen tilt and method of operation |
摘要 |
An instrument and method for scanning large microscope specimen on a specimen holder has a scanning optical microscope that is configured to scan the specimen in one of brightfield and fluorescence. The specimen is dynamically tillable about a scan direction during a scan to maintain focus along the length of each scan line as the scan proceeds. A three dimensional image of the specimen can be obtained wherein the specimen tilt and relative focus are maintained from a first image contour to a second image contour through a thickness of a specimen. |
申请公布号 |
US9575308(B2) |
申请公布日期 |
2017.02.21 |
申请号 |
US201314387457 |
申请日期 |
2013.03.21 |
申请人 |
Huron Technologies International Inc. |
发明人 |
Dixon Arthur Edward;Damaskinos Savvas |
分类号 |
G02B21/36;G02B21/26;G02B21/00;G02B21/12;G02B21/16 |
主分类号 |
G02B21/36 |
代理机构 |
|
代理人 |
Schnurr Daryl W. |
主权项 |
1. An instrument for scanning a large microscope specimen on a specimen holder, the instrument comprising a scanning optical microscope that is configured to scan the specimen in one of brightfield and fluorescence, the specimen being dynamically tiltable about a scan direction during a scan to maintain focus along a length of each scan line as the scan proceeds, a two dimensional detector array receiving data from the scan using Moving Specimen Image Averaging. |
地址 |
Waterloo, ON CA |