发明名称 Device comprising a ductile layer and method of making the same
摘要 Device comprising a ductile layer, a method for making a component comprising a ductile layer and a method for testing a component are disclosed. An embodiment includes an electronic device including a first conductive layer, a ductile layer and a brittle layer between the first conductive layer and the ductile layer.
申请公布号 US9576867(B2) 申请公布日期 2017.02.21
申请号 US201615093528 申请日期 2016.04.07
申请人 Infineon Technologies AG 发明人 Meyer-Berg Georg;Pufall Reinhard
分类号 H01L23/48;H01L21/66;G01R31/26;G01R31/28;H01L23/58;H01L21/768;H01L23/532;H01L23/00;H01L23/522;H01L23/525 主分类号 H01L23/48
代理机构 Slater Matsil, LLP 代理人 Slater Matsil, LLP
主权项 1. A component comprising: a substrate; a first metal line disposed over the substrate; an insulating layer disposed over the first metal line; a second metal line disposed over the insulating layer; a ductile metal layer disposed between the first metal line and the second metal line, wherein the ductile metal layer is composed of a different metal than the first metal line, and wherein the ductile metal layer comprises tin, indium, or undoped aluminum and the first metal line comprises copper; and a metal barrier layer disposed between the first metal line and the second metal line, wherein the metal barrier layer is disposed directly beneath the second metal line, wherein the ductile metal layer is disposed directly beneath the metal barrier layer, and wherein the insulating layer is disposed directly beneath the ductile metal layer.
地址 Neubiberg DE