发明名称 Selecting features from image data
摘要 SIFT features are selected from an input image. A SIFT procedure is applied to the input image to obtain candidate keypoints. For each candidate keypoint, there is calculation of a first Laplacian value (Lu) for pixels in an upper Scale Space and a second Laplacian value (Ll) for pixels in a lower Scale Space, based on the position of the candidate keypoint. A candidate keypoint is discarded if a Laplacian value Lc of the keypoint position is less than or equal to either of Lu or Ll. In the case that the candidate keypoint is not discarded, the candidate keypoint's Laplacian strength (Ls) is calculated, based on a relative change in Laplacian value from Lc to Lu and from Lc to Ll. One or more candidate keypoints are selected as SIFT features based on the corresponding Laplacian strength.
申请公布号 US9576218(B2) 申请公布日期 2017.02.21
申请号 US201414532625 申请日期 2014.11.04
申请人 CANON KABUSHIKI KAISHA 发明人 Huang Hung Khei;Denney Bradley Scott
分类号 G06K9/46 主分类号 G06K9/46
代理机构 Fitzpatrick, Cella, Harper & Scinto 代理人 Fitzpatrick, Cella, Harper & Scinto
主权项 1. A method for selecting SIFT features from an input image, the method comprising: applying a SIFT procedure to the input image to obtain candidate keypoints; calculating, for each candidate keypoint, a first Laplacian value (Lu) for pixels in an upper Scale Space and a second Laplacian value (Ll) for pixels in a lower Scale Space, based on the position of the candidate keypoint; discarding a candidate keypoint if a Laplacian value Lc of the keypoint position is less than or equal to either of Lu or Ll; calculating, in the case that the candidate keypoint is not discarded, the candidate keypoint's Laplacian strength (Ls) based on a relative change in Laplacian value from Lc to Lu and from Lc to Ll; and selecting one or more candidate keypoints as SIFT features based on the corresponding Laplacian strength.
地址 Tokyo JP