发明名称 |
Devices, systems, and methods for knowledge-based inference for material recognition |
摘要 |
Systems, devices, and methods for material recognition extract one or more features from a patch in an image of a scene; generate an initial prediction of a material category of the patch from candidate material categories based on the one or more features; identify a scene in the image; identify one or more objects in the image; obtain a first relationship model of two or more of the one or more features, the candidate material categories, the one or more objects, and the scene; and make a refined prediction of the material category of the patch based on the initial prediction of the material category and on the first relationship model. |
申请公布号 |
US9576203(B2) |
申请公布日期 |
2017.02.21 |
申请号 |
US201514699344 |
申请日期 |
2015.04.29 |
申请人 |
Canon Kabushiki Kaisha |
发明人 |
Yu Jie |
分类号 |
G06K9/00;G06K9/46;G06K9/62 |
主分类号 |
G06K9/00 |
代理机构 |
Canon U.S.A., Inc. IP Division |
代理人 |
Canon U.S.A., Inc. IP Division |
主权项 |
1. A method comprising:
extracting one or more features from a patch in an image of a scene; generating an initial prediction of a material category of the patch from candidate material categories based on the one or more features; identifying a scene in the image; identifying one or more objects in the image; obtaining a first relationship model of two or more of
the one or more features, the candidate material categories, the one or more objects, and the scene; and generating a refined prediction of the material category of the patch based on the initial prediction of the material category and on the first relationship model. |
地址 |
Tokyo JP |