发明名称 Devices, systems, and methods for knowledge-based inference for material recognition
摘要 Systems, devices, and methods for material recognition extract one or more features from a patch in an image of a scene; generate an initial prediction of a material category of the patch from candidate material categories based on the one or more features; identify a scene in the image; identify one or more objects in the image; obtain a first relationship model of two or more of the one or more features, the candidate material categories, the one or more objects, and the scene; and make a refined prediction of the material category of the patch based on the initial prediction of the material category and on the first relationship model.
申请公布号 US9576203(B2) 申请公布日期 2017.02.21
申请号 US201514699344 申请日期 2015.04.29
申请人 Canon Kabushiki Kaisha 发明人 Yu Jie
分类号 G06K9/00;G06K9/46;G06K9/62 主分类号 G06K9/00
代理机构 Canon U.S.A., Inc. IP Division 代理人 Canon U.S.A., Inc. IP Division
主权项 1. A method comprising: extracting one or more features from a patch in an image of a scene; generating an initial prediction of a material category of the patch from candidate material categories based on the one or more features; identifying a scene in the image; identifying one or more objects in the image; obtaining a first relationship model of two or more of the one or more features, the candidate material categories, the one or more objects, and the scene; and generating a refined prediction of the material category of the patch based on the initial prediction of the material category and on the first relationship model.
地址 Tokyo JP