发明名称 SEMICONDUCTOR DEVICE AND METHOD OF MANUFACTURING THE SAME
摘要 A semiconductor device according to the present invention includes a semiconductor layer provided with a gate trench, a first conductivity type source region formed to be exposed on a surface side of the semiconductor layer, a second conductivity type channel region formed on a side of the source region closer to a back surface of the semiconductor layer to be in contact with the source region, a first conductivity type drain region formed on a side of the channel region closer to the back surface of the semiconductor layer to be in contact with the channel region, a gate insulating film formed on an inner surface of the gate trench, and a gate electrode embedded inside the gate insulating film in the gate trench, while the channel region includes a channel portion formed along the side surface of the gate trench so that a channel is formed in operation and a projection projecting from an end portion of the channel portion closer to the back surface of the semiconductor layer toward the back surface.
申请公布号 US2017047441(A1) 申请公布日期 2017.02.16
申请号 US201615336985 申请日期 2016.10.28
申请人 ROHM CO., LTD. 发明人 OMORI Kengo
分类号 H01L29/78;H01L21/265;H01L29/417;H01L29/66 主分类号 H01L29/78
代理机构 代理人
主权项 1. A semiconductor device comprising: a semiconductor layer provided with a gate trench; a first conductivity type source region formed to be exposed on a surface side of the semiconductor layer for forming part of a side surface of the gate trench; a second conductivity type channel region formed on a side of the source region closer to a back surface of the semiconductor layer to be in contact with the source region for forming part of the side surface of the gate trench; a first conductivity type drain region formed on a side of the channel region closer to the back surface of the semiconductor layer to be in contact with the channel region for forming a bottom surface of the gate trench; a gate insulating film formed on an inner surface of the gate trench; and a gate electrode embedded inside the gate insulating film in the gate trench, wherein the channel region includes a channel portion formed along the side surface of the gate trench so that a channel is formed in operation, a recess portion formed from the surface side in the channel portion such that the recess portion is concaved toward the back surface side of the semiconductor layer with respect to a contact surface between the source region and the channel region and a projection projecting from an end portion of the channel portion toward the back surface of the semiconductor layer in the form of a parabola.
地址 Kyoto JP