发明名称 |
SEMICONDUCTOR DEVICE AND METHOD OF MANUFACTURING THE SAME |
摘要 |
A semiconductor device according to the present invention includes a semiconductor layer provided with a gate trench, a first conductivity type source region formed to be exposed on a surface side of the semiconductor layer, a second conductivity type channel region formed on a side of the source region closer to a back surface of the semiconductor layer to be in contact with the source region, a first conductivity type drain region formed on a side of the channel region closer to the back surface of the semiconductor layer to be in contact with the channel region, a gate insulating film formed on an inner surface of the gate trench, and a gate electrode embedded inside the gate insulating film in the gate trench, while the channel region includes a channel portion formed along the side surface of the gate trench so that a channel is formed in operation and a projection projecting from an end portion of the channel portion closer to the back surface of the semiconductor layer toward the back surface. |
申请公布号 |
US2017047441(A1) |
申请公布日期 |
2017.02.16 |
申请号 |
US201615336985 |
申请日期 |
2016.10.28 |
申请人 |
ROHM CO., LTD. |
发明人 |
OMORI Kengo |
分类号 |
H01L29/78;H01L21/265;H01L29/417;H01L29/66 |
主分类号 |
H01L29/78 |
代理机构 |
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代理人 |
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主权项 |
1. A semiconductor device comprising:
a semiconductor layer provided with a gate trench; a first conductivity type source region formed to be exposed on a surface side of the semiconductor layer for forming part of a side surface of the gate trench; a second conductivity type channel region formed on a side of the source region closer to a back surface of the semiconductor layer to be in contact with the source region for forming part of the side surface of the gate trench; a first conductivity type drain region formed on a side of the channel region closer to the back surface of the semiconductor layer to be in contact with the channel region for forming a bottom surface of the gate trench; a gate insulating film formed on an inner surface of the gate trench; and a gate electrode embedded inside the gate insulating film in the gate trench, wherein the channel region includes a channel portion formed along the side surface of the gate trench so that a channel is formed in operation, a recess portion formed from the surface side in the channel portion such that the recess portion is concaved toward the back surface side of the semiconductor layer with respect to a contact surface between the source region and the channel region and a projection projecting from an end portion of the channel portion toward the back surface of the semiconductor layer in the form of a parabola. |
地址 |
Kyoto JP |