OPTIMIZING A SLICE ORIENTATION

摘要

A method for optimizing a slice orientation for an examination using a magnetic resonance machine is provided. One or more device limitation of the magnetic resonance machine is provided. The device limitation includes, for at least one of the one or more gradient axes, a maximum gradient strength and/or a maximum gradient slew rate. At least one measurement parameter value of the examination and an original slice orientation are also provided. Rotational-angle information is determined from device limitations, measurement parameter values, and the original slice orientation. The rotational-angle information is used to optimize the original slice orientation, and the magnetic resonance machine captures measurement data on the basis of the optimized slice orientation.

主权项

1. A method for optimizing a slice orientation for an examination using a magnetic resonance machine having one or more gradient axes, the method comprising:
providing at least one device limitation of the magnetic resonance machine, wherein the least one device limitation comprises for at least one of the one or more gradient axes: a maximum gradient strength, a maximum gradient slew rate, or a maximum gradient strength and a maximum gradient slew rate; providing at least one measurement parameter value of the examination; providing an original slice orientation; determining rotational-angle information from the at least one device limitation and from the at least one measurement parameter value and the original slice orientation; optimizing the original slice orientation using the rotational-angle information; and capturing, by the magnetic resonance machine, measurement data based on the optimized slice orientation.