| 发明名称 |
CIRCUIT PROBING SYSTEM AND ITS CIRCUIT PROBING DEVICE |
| 摘要 |
A circuit probing system and a circuit probing device thereof are provided. The circuit probing device includes a probe card and a protective lid. The probe card is provided with a pin area, a bore hole and a first magnetic attraction member disposed in the bore hole. The protective lid is provided with a second magnetic attraction member. When the protective lid covers the probe pin area, and the second magnetic attraction member inserts into the bore hole, the protective lid is fixed on the probe card as the first magnetic attraction member and the second magnetic attraction member magnetically attract with each other. |
| 申请公布号 |
US2017045554(A1) |
申请公布日期 |
2017.02.16 |
| 申请号 |
US201514934109 |
申请日期 |
2015.11.05 |
| 申请人 |
GLOBAL UNICHIP CORPORATION ;TAIWAN SEMICONDUCTOR MANUFACTURING CO., LTD. |
发明人 |
LIAO Chih-Chieh;SUN Yu-Min;CHENG Chih-Feng |
| 分类号 |
G01R1/16;G01R1/04 |
主分类号 |
G01R1/16 |
| 代理机构 |
|
代理人 |
|
| 主权项 |
1. A circuit probing device comprising:
a probe card having a probe pin area, at least one bore hole, and at least one first magnetic attraction member is disposed in the bore hole; a protective lid having at least one second magnetic attraction member, wherein, when the protective lid covers the probe pin area of the probe card, and the second magnetic attraction member inserts into the bore hole of the probe card, the protective lid is fixed on the probe card as the first magnetic attraction member and the second magnetic attraction member magnetically attract with each other. |
| 地址 |
HSINCHU CITY TW |
