发明名称 |
METHOD FOR MANUFACTURING SEMICONDUCTOR DEVICE, SUBSTRATE PROCESSING APPARATUS, AND RECORDING MEDIUM |
摘要 |
To provide a technology of performing stable etching at a desired etching rate in etching processing of a silicon layer. The present invention has: a step for carrying a substrate into a processing chamber, said substrate having a silicon layer that is formed on the surface; a step for supplying an etching gas to the inside of the processing chamber after the substrate is carried into the processing chamber, said etching gas being supplied for the purpose of etching silicon; a step for maintaining a state wherein the etching gas supply and air release from the inside of the processing chamber are stopped; and a step for supplying the etching gas to the inside of the processing chamber, while releasing air from the inside of the processing chamber. |
申请公布号 |
WO2017026001(A1) |
申请公布日期 |
2017.02.16 |
申请号 |
WO2015JP72465 |
申请日期 |
2015.08.07 |
申请人 |
HITACHI KOKUSAI ELECTRIC INC. |
发明人 |
TSUBOTA, Yasutoshi;HIYAMA, Shin;YANAI, Hidehiro;AMANO, Tomihiro;ICHIMURA, Keita |
分类号 |
H01L21/3065 |
主分类号 |
H01L21/3065 |
代理机构 |
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代理人 |
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主权项 |
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地址 |
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