发明名称 REDUCING LEAD STRESS IN MICRO-ELECTRONIC PACKAGES
摘要 Consistent with an example embodiment, there is a semiconductor device that comprises a lead frame assembly having a non-conductive material (NCM) sheet placed on a location of the lead frame assembly. A device die having a length, width, and thickness, is attached to the NCM sheet, the device die being attached to the NCM with an adhesive. The NCM sheet has a length and width greater than the length and width of the device die and the NCM sheet has a thickness less than the thickness of the device die. The NCM sheet mitigates wire bond lifting at device die bond pads by reducing bouncing of the wire bond leads owing to stress and movement of the lead frame assembly underneath the device die.
申请公布号 US2017047275(A1) 申请公布日期 2017.02.16
申请号 US201514823486 申请日期 2015.08.11
申请人 NXP B.V. 发明人 Tanwongwan Wiwat
分类号 H01L23/495;H01L21/56;H01L21/52 主分类号 H01L23/495
代理机构 代理人
主权项 1. A semiconductor device comprising: a lead frame assembly having a non-conductive material (NCM) sheet placed on a location of the lead frame assembly; a device die having a length, width, and thickness attached to the NCM sheet, the device die being attached to the NCM with an adhesive; wherein the NCM sheet has a length and width greater than the length and width of the device die; and wherein the NCM sheet has a thickness less than the thickness of the device die.
地址 Eindhoven NL