发明名称 SEMICONDUCTOR DEVICE AND METHOD OF FABRICATING THE SAME
摘要 A semiconductor device includes a semiconductor substrate comprising a group III element and a group V element, and a gate structure on the semiconductor substrate. The semiconductor substrate includes a first region which contacts a bottom surface of the gate structure and a second region which is disposed under the first region. The concentration of the group III element in the first region is lower than that of the group V element in the first region, and the concentration of the group III element in the second region is substantially equal to that of the group V element in the second region.
申请公布号 US2017047433(A1) 申请公布日期 2017.02.16
申请号 US201615335885 申请日期 2016.10.27
申请人 Samsung Electronics Co., Ltd. 发明人 Lim Ha-Jin;Kim Hyeong-Joon;Lee Nae-In
分类号 H01L29/66;H01L21/28;H01L21/02 主分类号 H01L29/66
代理机构 代理人
主权项 1. A method of fabricating a semiconductor device, the method comprising: providing a semiconductor substrate comprising a group III element and a group V element; forming an oxide layer by oxidizing a top surface of the semiconductor substrate; removing the oxide layer; and forming a gate structure on the semiconductor substrate,wherein the semiconductor substrate comprises: a first region directly contacting a bottom surface of the gate structure; and a second region disposed under the first region,wherein the concentration of the group III element in the first region is lower than that of the group V element in the first region, and the concentration of the group III element in the second region is substantially equal to that of the group V element in the second region.
地址 Suwon-si KR