发明名称 |
SEMICONDUCTOR DEVICE AND METHOD OF FABRICATING THE SAME |
摘要 |
A semiconductor device includes a semiconductor substrate comprising a group III element and a group V element, and a gate structure on the semiconductor substrate. The semiconductor substrate includes a first region which contacts a bottom surface of the gate structure and a second region which is disposed under the first region. The concentration of the group III element in the first region is lower than that of the group V element in the first region, and the concentration of the group III element in the second region is substantially equal to that of the group V element in the second region. |
申请公布号 |
US2017047433(A1) |
申请公布日期 |
2017.02.16 |
申请号 |
US201615335885 |
申请日期 |
2016.10.27 |
申请人 |
Samsung Electronics Co., Ltd. |
发明人 |
Lim Ha-Jin;Kim Hyeong-Joon;Lee Nae-In |
分类号 |
H01L29/66;H01L21/28;H01L21/02 |
主分类号 |
H01L29/66 |
代理机构 |
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代理人 |
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主权项 |
1. A method of fabricating a semiconductor device, the method comprising:
providing a semiconductor substrate comprising a group III element and a group V element; forming an oxide layer by oxidizing a top surface of the semiconductor substrate; removing the oxide layer; and forming a gate structure on the semiconductor substrate,wherein the semiconductor substrate comprises:
a first region directly contacting a bottom surface of the gate structure; and a second region disposed under the first region,wherein the concentration of the group III element in the first region is lower than that of the group V element in the first region, and the concentration of the group III element in the second region is substantially equal to that of the group V element in the second region. |
地址 |
Suwon-si KR |