发明名称 NONVOLATILE SEMICONDUCTOR MEMORY DEVICE AND METHOD OF MANUFACTURING THE SAME
摘要 A nonvolatile semiconductor memory device according to an embodiment comprises: a silicon substrate; and a plurality of memory cells that nonvolatilely accumulate a charge as data, disposed along at least a first direction, on the substrate. A diffusion layer is disposed continuously in a surface of the substrate of a region straddling the plurality of memory cells disposed along the first direction. The memory cell incudes an epitaxial silicon layer disposed on the diffusion layer.
申请公布号 US2017047337(A1) 申请公布日期 2017.02.16
申请号 US201615067892 申请日期 2016.03.11
申请人 Kabushiki Kaisha Toshiba 发明人 TAKEKIDA Hideto
分类号 H01L27/115;H01L23/535;G11C16/04 主分类号 H01L27/115
代理机构 代理人
主权项 1. A nonvolatile semiconductor memory device, comprising: a silicon substrate; a plurality of memory cells disposed along at least a first direction, on the substrate, the plurality of the memory cells nonvolatilely accumulating a charge; and a diffusion layer disposed continuously in a surface of the substrate of a region straddling the plurality of memory cells disposed along the first direction; wherein the memory cell includes an epitaxial silicon layer disposed on the diffusion layer.
地址 Minato-ku JP