发明名称 |
NONVOLATILE SEMICONDUCTOR MEMORY DEVICE AND METHOD OF MANUFACTURING THE SAME |
摘要 |
A nonvolatile semiconductor memory device according to an embodiment comprises: a silicon substrate; and a plurality of memory cells that nonvolatilely accumulate a charge as data, disposed along at least a first direction, on the substrate. A diffusion layer is disposed continuously in a surface of the substrate of a region straddling the plurality of memory cells disposed along the first direction. The memory cell incudes an epitaxial silicon layer disposed on the diffusion layer. |
申请公布号 |
US2017047337(A1) |
申请公布日期 |
2017.02.16 |
申请号 |
US201615067892 |
申请日期 |
2016.03.11 |
申请人 |
Kabushiki Kaisha Toshiba |
发明人 |
TAKEKIDA Hideto |
分类号 |
H01L27/115;H01L23/535;G11C16/04 |
主分类号 |
H01L27/115 |
代理机构 |
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代理人 |
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主权项 |
1. A nonvolatile semiconductor memory device, comprising:
a silicon substrate; a plurality of memory cells disposed along at least a first direction, on the substrate, the plurality of the memory cells nonvolatilely accumulating a charge; and a diffusion layer disposed continuously in a surface of the substrate of a region straddling the plurality of memory cells disposed along the first direction; wherein the memory cell includes an epitaxial silicon layer disposed on the diffusion layer. |
地址 |
Minato-ku JP |