A tray loading system for tested electronic components including a tray loading bin adapted to prevent trays of a first configuration from being operably received in a first bin operating mode and to operably receive trays of the first configuration in a second bin operating mode. The system also includes an operating mode switching assembly adapted to automatically change from the second operating mode to the first operating mode in response to an operation associated with removal of loaded trays of the first configuration from the tray loading bin.
申请公布号
EP3130210(A1)
申请公布日期
2017.02.15
申请号
EP20150777499
申请日期
2015.04.10
申请人
Texas Instruments Incorporated
发明人
RAMIREZ, JR. Daniel Mendoza;NIEVA, Giovanni Hufana;MACARANAS, Alvin Noel M.;AQUINO, Brian Sardoma