发明名称 荷電粒子線装置
摘要 PROBLEM TO BE SOLVED: To solve the problem in which: when positional deviation occurs according to a scanning direction of electron beams, the amount of deviation becomes different for each scanning direction in reciprocating scanning, and therefore, continuity of images is lost and a correct image cannot be obtained; every image is deviated in the same direction in a one-way scanning, and the center position of the images is deviated; and if the center position of the images is deviated, a field of view becomes different when the images are enlarged or reduced.SOLUTION: A charged particle beam device includes: a deflector that scans beams emitted from a charged particle source on a sample; a scanning signal generating unit that generates scanning signals to be provided to the deflector; a detecting unit that detects charged particles obtained on the basis of the irradiation of the beams emitted from the charged particle source; an AD conversion unit that digitally converts the output of the detecting unit; a control unit that generates operation timing of the deflector; and a delaying unit that delays the operation timing. The AD conversion unit is operated at the operation timing delayed by the delaying unit.
申请公布号 JP6080565(B2) 申请公布日期 2017.02.15
申请号 JP20130010790 申请日期 2013.01.24
申请人 株式会社日立ハイテクノロジーズ 发明人 高橋 弘之;岩崎 孝志;森 渉;ホック シャヘドゥル
分类号 H01J37/147;H01J37/22;H01J37/28 主分类号 H01J37/147
代理机构 代理人
主权项
地址