发明名称 エッチング反応ガスの除害方法およびスクラバ装置
摘要 PROBLEM TO BE SOLVED: To provide a technology of removing a harmful component contained in reaction gas generated in etching silicon material with a nitrohydrofluoric solution efficiently at low cost without using an agent for detoxification wherever possible.SOLUTION: Reaction gas is introduced to an alkali aqueous solution as an absorbent in removing a harmful component contained in the reaction gas generated in etching silicon material with an acid mixture liquid containing hydrofluoric acid and nitric acid. The alkali aqueous solution is circulated in a circulation tank until reaching oversaturation, and crystallization product containing the harmful component is formed in the oversaturated alkali aqueous solution, or the crystallization product containing the harmful component is formed in a periphery of a reaction gas introducing part which introduces the reaction gas to the alkali aqueous solution as the absorbent, and the crystallization product is separated to remove the harmful component contained in the reaction gas.
申请公布号 JP6082339(B2) 申请公布日期 2017.02.15
申请号 JP20130240874 申请日期 2013.11.21
申请人 信越化学工業株式会社 发明人 宮尾 秀一;渡辺 和則
分类号 B01D53/56;B01D53/18;B01D53/68;H01L21/306 主分类号 B01D53/56
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