发明名称 |
Display substrate, method of manufacturing the same |
摘要 |
The present invention discloses a thin film transistor (TFT), a method for manufacturing the TFT, and a display substrate using the TFT that may prevent degradation of the characteristics of an oxide semiconductor contained in the TFT by blocking external light from entering a channel region of the oxide semiconductor. The TFT includes an oxide semiconductor layer; a protective layer overlapping a channel region of the oxide semiconductor layer; an opaque layer disposed between the oxide semiconductor layer and the protective layer; a source electrode contacting a first side of the oxide semiconductor layer; a drain electrode contacting a second side of the oxide semiconductor layer and facing the source electrode across the channel region; a gate electrode to apply an electric field to the oxide semiconductor layer; and a gate insulating layer disposed between the gate electrode and the oxide semiconductor layer. |
申请公布号 |
US9570621(B2) |
申请公布日期 |
2017.02.14 |
申请号 |
US201012977853 |
申请日期 |
2010.12.23 |
申请人 |
Samsung Display Co., Ltd. |
发明人 |
Jeong Ki-Hun;Kim Do-Hyun;Lee Dong-Hoon;Yoon Kap-Soo;Choi Jae-Ho;Yang Sung-Hoon;Yun Pil-Sang;Seo Seung-Mi |
分类号 |
H01L29/10;H01L29/12;H01L29/786 |
主分类号 |
H01L29/10 |
代理机构 |
H.C. Park & Associates, PLC |
代理人 |
H.C. Park & Associates, PLC |
主权项 |
1. A thin film transistor (TFT), comprising:
an oxide semiconductor layer; a protective layer disposed on the oxide semiconductor layer and overlapping a channel region of the oxide semiconductor layer, the protective layer being an electrical insulator; an opaque layer disposed between the oxide semiconductor layer and the protective layer; a source electrode disposed on a first side of the oxide semiconductor layer; a drain electrode disposed on a second side of the oxide semiconductor layer and facing the source electrode with the channel region disposed between the drain electrode and the source electrode; a gate electrode configured to apply an electric field to the oxide semiconductor layer; and a gate insulating layer disposed between the gate electrode and the oxide semiconductor layer. |
地址 |
Yongin-si KR |