发明名称 Display substrate, method of manufacturing the same
摘要 The present invention discloses a thin film transistor (TFT), a method for manufacturing the TFT, and a display substrate using the TFT that may prevent degradation of the characteristics of an oxide semiconductor contained in the TFT by blocking external light from entering a channel region of the oxide semiconductor. The TFT includes an oxide semiconductor layer; a protective layer overlapping a channel region of the oxide semiconductor layer; an opaque layer disposed between the oxide semiconductor layer and the protective layer; a source electrode contacting a first side of the oxide semiconductor layer; a drain electrode contacting a second side of the oxide semiconductor layer and facing the source electrode across the channel region; a gate electrode to apply an electric field to the oxide semiconductor layer; and a gate insulating layer disposed between the gate electrode and the oxide semiconductor layer.
申请公布号 US9570621(B2) 申请公布日期 2017.02.14
申请号 US201012977853 申请日期 2010.12.23
申请人 Samsung Display Co., Ltd. 发明人 Jeong Ki-Hun;Kim Do-Hyun;Lee Dong-Hoon;Yoon Kap-Soo;Choi Jae-Ho;Yang Sung-Hoon;Yun Pil-Sang;Seo Seung-Mi
分类号 H01L29/10;H01L29/12;H01L29/786 主分类号 H01L29/10
代理机构 H.C. Park & Associates, PLC 代理人 H.C. Park & Associates, PLC
主权项 1. A thin film transistor (TFT), comprising: an oxide semiconductor layer; a protective layer disposed on the oxide semiconductor layer and overlapping a channel region of the oxide semiconductor layer, the protective layer being an electrical insulator; an opaque layer disposed between the oxide semiconductor layer and the protective layer; a source electrode disposed on a first side of the oxide semiconductor layer; a drain electrode disposed on a second side of the oxide semiconductor layer and facing the source electrode with the channel region disposed between the drain electrode and the source electrode; a gate electrode configured to apply an electric field to the oxide semiconductor layer; and a gate insulating layer disposed between the gate electrode and the oxide semiconductor layer.
地址 Yongin-si KR