发明名称 Magnetoresistive devices and methods for manufacturing magnetoresistive devices
摘要 A magnetoresistive device that can include a magnetoresistive stack and an etch-stop layer (ESL) disposed on the magnetoresistive stack. A method of manufacturing the magnetoresistive device can include: depositing the magnetoresistive stack, the ESL and a mask layer on a substrate; performing a first etching process to etch a portion of the mask layer to expose a portion of the ESL; and performing a second etching process to etch the exposed portion of the ESL and a portion of the magnetoresistive stack. The method can further include depositing a photoresist layer on the hard mask before the first etching process and removing the photoresist layer from the hard mask following the first etching process. The first and second etching processes can be different. For example, the first etching process can be a reactive etching process and the second etching process can be a non-reactive etching process.
申请公布号 US9570099(B2) 申请公布日期 2017.02.14
申请号 US201514717213 申请日期 2015.05.20
申请人 Infineon Technologies AG 发明人 Raberg Wolfgang;Strasser Andreas;Wendt Hermann;Pruegl Klemens
分类号 B44C1/22;G11B5/39 主分类号 B44C1/22
代理机构 Schiff Hardin LLP 代理人 Schiff Hardin LLP
主权项 1. A method for manufacturing a magnetoresistive device, the method comprising: depositing a magnetoresistive stack, an etch-stop layer (ESL), and a mask layer on a substrate; performing a first etching process to etch a portion of the mask layer to expose a portion of the ESL; and performing a second etching process to etch the exposed portion of the ESL and a portion of the magnetoresistive stack.
地址 Neubiberg DE
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