发明名称 Semiconductor device including a vertical edge termination structure and method of manufacturing
摘要 A semiconductor device includes a semiconductor body with a first surface at a first side, a second surface opposite to the first surface and an edge surface connecting the first and second surfaces. An edge termination structure includes a glass structure and extends along the edge surface, at least from a plane coplanar with the first surface towards the second surface. A conductive structure extends parallel to the first surface and overlaps the glass structure at the first side.
申请公布号 US9570542(B2) 申请公布日期 2017.02.14
申请号 US201414242366 申请日期 2014.04.01
申请人 Infineon Technologies AG 发明人 Breymesser Alexander;Brockmeier Andre;Falck Elmar;Santos Rodriguez Francisco Javier;Schulze Holger
分类号 H01L29/06;H01L29/32;H01L29/40;H01L29/66;H01L29/739;H01L29/861;H01L21/762;H01L29/16;H01L29/20;H01L29/22 主分类号 H01L29/06
代理机构 Murphy, Bilak & Homiller, PLLC 代理人 Murphy, Bilak & Homiller, PLLC
主权项 1. A semiconductor device, comprising: a semiconductor body with a first surface at a first side, a second surface opposite to the first surface and an edge surface connecting the first and second surfaces, wherein the semiconductor body comprises a drift zone from a first conductivity type the drift zone extending from an anode region to one of a pedestal region or a field stop layer, the drift zone forming a pn junction with the anode region and a unipolar homojunction with the field stop layer or the pedestal layer;an edge termination structure including a glass structure and extending along the edge surface at least from a plane coplanar with the first surface towards the second surface, wherein the glass structure results from a glass molding process and does not contain hydrocarbon compounds; anda conductive structure extending parallel to the first surface and overlapping the glass structure at the first side.
地址 Neubiberg DE