| 发明名称 | Apparatus and method for measuring tactile information | ||
| 摘要 | An apparatus and method for measuring a tactile information, using a material having variable pressure dependent properties is disclosed. The apparatus for measuring the tactile information may include a plurality of pressure measurement units to measure a magnitude of an external pressure using a material having variable properties, and a tactile information measurement unit to measure a three-dimensional (3D) tactile information based on the external pressure using a location of the plurality of pressure measurement units and a pressure measured by the plurality of pressure measurement units. | ||
| 申请公布号 | US9568379(B2) | 申请公布日期 | 2017.02.14 |
| 申请号 | US201314075426 | 申请日期 | 2013.11.08 |
| 申请人 | Samsung Electronics Co., Ltd.;Industry-Academic Cooperation Foundation, Yonsei University | 发明人 | Lim Soo-Chul;Kim Jong Baeg;Park Joon Ah;Pyo Soon Jae;Kim Min Ook;Lee Jae Ik;Chung Tae Young |
| 分类号 | G01L5/10;G01L1/14;G01L1/20;G01L5/16 | 主分类号 | G01L5/10 |
| 代理机构 | NSIP Law | 代理人 | NSIP Law |
| 主权项 | 1. An apparatus for measuring a tactile information, the apparatus comprising: pressure measurement units configured to measure a magnitude of an external pressure, using a material having variable pressure dependent properties; and a tactile information measurement unit configured to measure a three-dimensional (3D) tactile information based on an external pressure, using a location of the pressure measurement units and a pressure measured by the pressure measurement units, wherein the pressure measurement units determine the magnitude of the external pressure to be inversely proportional to a change in a capacitance of the material. | ||
| 地址 | Suwon-si KR | ||