发明名称 Adaptive anisotropic filtering
摘要 A method, graphics processing unit, and system are described herein. The method for adaptive anisotropic filtering includes calculating a number of ways of anisotropy based on a computed level of detail of a texture map and applying a bilinear low pass filter to a texture map's closest two MIP maps using a processor. An effective number of ways and filter sizes may be computed on each of the closest two closest MIP maps. Additionally, the closest two MIP maps may be sampled at their respective effective number of ways. The method also includes applying a corresponding sized low pass filters to each of the closest two MIP maps, and combining the filtered closest two MIP maps using a weighted sum based on a fractional part of a computed level of detail.
申请公布号 US9569880(B2) 申请公布日期 2017.02.14
申请号 US201314140180 申请日期 2013.12.24
申请人 Intel Corporation 发明人 Chatterjee Prosun;Seiler Larry;Chandra Joy;Pletcher Benjamin R.
分类号 G06T15/04 主分类号 G06T15/04
代理机构 International IP Law Group, P.L.L.C. 代理人 International IP Law Group, P.L.L.C.
主权项 1. A method for adaptive anisotropic filtering, comprising: calculating a number of ways of anisotropy based on a computed level of detail of a texture map; applying a bilinear low pass filter to a texture map's closest two MIP maps using a processor; computing an effective number of ways and filter sizes on each of the closest two closest MIP maps, wherein computing the effective number of ways for each of the two closest MIP maps comprises first computing the anisotropic ratio on each MIP map from an original anisotropic ratio by multiplying by a power of two of the fractional level of detail for a lower MIP map of the two closest MIP maps, and dividing for a higher MIP map of the two closest MIP maps; sampling the closest two MIP maps at their respective effective number of ways; applying a corresponding sized low pass filter to each of the closest two MIP maps; and combining the filtered closest two MIP maps using a weighted sum based on a fractional part of a computed level of detail.
地址 Santa Clara CA US