发明名称 |
Method of manufacturing a semiconductor device |
摘要 |
Semiconductor devices and methods of manufacture thereof are disclosed. In some embodiments, a method of manufacturing a semiconductor device includes: providing a workpiece having a recess and a dielectric layer lining the recess; forming a conductive structure within the recess, wherein the conductive structure partially fills the recess; and recessing the dielectric layer, wherein, after the recessing, a top surface of the recessed dielectric layer is disposed within the recess. |
申请公布号 |
US9570319(B2) |
申请公布日期 |
2017.02.14 |
申请号 |
US201414292048 |
申请日期 |
2014.05.30 |
申请人 |
Taiwan Semiconductor Manufacturing Company, Ltd. |
发明人 |
Lin Yu Chao;Chang Ming-Ching;Chen Chao-Cheng |
分类号 |
H01L21/8234;H01L21/321;H01L21/3105;H01L29/66;H01L21/311;H01L21/84;H01L21/8238;H01L21/02;H01L21/3213 |
主分类号 |
H01L21/8234 |
代理机构 |
Slater Matsil, LLP |
代理人 |
Slater Matsil, LLP |
主权项 |
1. A method of manufacturing a semiconductor device, the method comprising:
providing a workpiece having a recess and a dielectric layer having a first portion lining the recess and a second portion lining a top surface of the workpiece; forming a conductive structure within the recess, wherein: the conductive structure partially fills the recess; the conductive structure comprises topmost lateral extents disposed within the recess; and formation of the conductive structure leaves the second portion of the dielectric layer exposed; and after forming the conductive structure, removing the second portion of the dielectric layer and exposed regions of the first portion of the dielectric layer, wherein, after the removing, a top surface of the recessed dielectric layer is disposed within the recess, and the recessed dielectric layer is substantially coplanar with a to surface of the conductive structure formed within the recess. |
地址 |
Hsin-Chu TW |