发明名称 Method of manufacturing a semiconductor device
摘要 Semiconductor devices and methods of manufacture thereof are disclosed. In some embodiments, a method of manufacturing a semiconductor device includes: providing a workpiece having a recess and a dielectric layer lining the recess; forming a conductive structure within the recess, wherein the conductive structure partially fills the recess; and recessing the dielectric layer, wherein, after the recessing, a top surface of the recessed dielectric layer is disposed within the recess.
申请公布号 US9570319(B2) 申请公布日期 2017.02.14
申请号 US201414292048 申请日期 2014.05.30
申请人 Taiwan Semiconductor Manufacturing Company, Ltd. 发明人 Lin Yu Chao;Chang Ming-Ching;Chen Chao-Cheng
分类号 H01L21/8234;H01L21/321;H01L21/3105;H01L29/66;H01L21/311;H01L21/84;H01L21/8238;H01L21/02;H01L21/3213 主分类号 H01L21/8234
代理机构 Slater Matsil, LLP 代理人 Slater Matsil, LLP
主权项 1. A method of manufacturing a semiconductor device, the method comprising: providing a workpiece having a recess and a dielectric layer having a first portion lining the recess and a second portion lining a top surface of the workpiece; forming a conductive structure within the recess, wherein: the conductive structure partially fills the recess; the conductive structure comprises topmost lateral extents disposed within the recess; and formation of the conductive structure leaves the second portion of the dielectric layer exposed; and after forming the conductive structure, removing the second portion of the dielectric layer and exposed regions of the first portion of the dielectric layer, wherein, after the removing, a top surface of the recessed dielectric layer is disposed within the recess, and the recessed dielectric layer is substantially coplanar with a to surface of the conductive structure formed within the recess.
地址 Hsin-Chu TW