发明名称 Ring architecture for sequential operation of an atomic gyroscope
摘要 Compact inertial measurement systems and methods based on atom interferometry. Certain examples provide a combination atomic accelerometer-gyroscope configured to recapture and cycle atom samples through atom interferometers arranged to allow the next measurement to use the atoms from the previous measurement. Examples of the apparatus provide inertial measurements indicative of rotation for different inertial axes by applying atom interferometry to a plurality of atom samples launched in opposite directions to allow for measurement of both acceleration and rotation rates. In some examples, the inertial measurement apparatus provide a combined atomic gyroscope and an atomic accelerometer in a compact six Degrees of Freedom (6 DOF) IMU.
申请公布号 US9568316(B2) 申请公布日期 2017.02.14
申请号 US201414214767 申请日期 2014.03.15
申请人 THE CHARLES STARK DRAPER LABORATORY, INC. 发明人 Johnson David M. S.;Butts David L.;Stoner Richard E.
分类号 G01B9/02;G01C19/62;G01C21/18;G01C19/02;G01C21/16;G01C19/58 主分类号 G01B9/02
代理机构 Lando & Anastasi, LLP 代理人 Lando & Anastasi, LLP
主权项 1. An inertial measurement apparatus based on atom interferometry and comprising: a vacuum chamber; a plurality of atom interferometers including at least a first atom interferometer and a second atom interferometer, the first atom interferometer being configured to generate a first measurement corresponding to a common inertial input based on a first atom sample, and the second atom interferometer being configured to generate a second measurement corresponding to the common inertial input; and a plurality of atom capture sites housed within the vacuum chamber, the plurality of atom capture sites including at least a first atom capture site and a second atom capture site, the first atom capture site being configured to capture the first atom sample and to provide the first atom sample to the first atom interferometer, and the second atom capture site being configured to recapture the first atom sample from the first atom interferometer, following the first measurement, and to provide the first atom sample to the second atom interferometer, the second atom capture site being further configured to capture a second atom sample different from the first atom sample and to provide the second atom sample to a respective atom interferometer of the plurality of atom interferometers.
地址 Cambridge MA US