Testing fuse configurations in semiconductor devices

摘要

A system includes a first integrated circuit configured to operate in at least a normal mode and a test mode and a second integrated circuit, where both the first integrated circuit and the second integrated circuit are disposed within a same semiconductor device package. The system further includes a first terminal, external to the semiconductor device package, electronically coupled to the first integrated circuit and the second integrated circuit. The first terminal is electronically coupled to a buffer in the second integrated circuit and used to convey signals to or from the first integrated circuit.

主权项

1. A system comprising:
a first integrated circuit configured to operate in at least a normal mode and a test mode, wherein the first integrated circuit comprises a memory device, the memory device comprising a latch and a fuse, the latch to receive fuse configuration data and to output a soft-blow signal based on the fuse configuration data, the soft-blow signal to configure the fuse; a second integrated circuit comprising a buffer, wherein the second integrated circuit comprises a memory controller, both the first integrated circuit and the second integrated circuit being disposed within the same semiconductor device package; a first terminal external to the semiconductor device package, electronically coupled to the first integrated circuit and the second integrated circuit, the first terminal electronically coupled to the buffer in the second integrated circuit and used to convey signals to or from the first integrated circuit.