发明名称 METHOD OF ELECTROPLATING PHOTORESIST DEFINED FEATURES FROM COPPER ELECTROPLATING BATHS CONTAINING REACTION PRODUCTS OF IMIDAZOLE AND BISEPOXIDE COMPOUNDS
摘要 Electroplating methods enable the plating of photoresist defined features which have substantially uniform morphology. The electroplating methods include copper electroplating baths with reaction products of imidazole and bisepoxides to electroplate the photoresist defined features. Such features include pillars, bond pads and line space features.
申请公布号 US2017037526(A1) 申请公布日期 2017.02.09
申请号 US201615220467 申请日期 2016.07.27
申请人 Rohm and Haas Electronic Materials LLC ;Dow Global Technologies LLC 发明人 Thorseth Matthew;Niazimbetova Zuhra;Qin Yi;Woertink Julia;Dziewiszek Joanna;Reddington Erik;Lefebvre Mark
分类号 C25D3/38;H01L21/768;H01L23/522;H01L23/532;H05K1/11;C25D5/02;G03F7/40;H05K3/06;H05K3/40;H01L23/00;C25D7/12 主分类号 C25D3/38
代理机构 代理人
主权项 1. A method of electroplating photoresist defined features comprising: a) providing a substrate comprising a layer of photoresist, wherein the layer of photoresist comprises a plurality of apertures; b) providing a copper electroplating bath comprising one or more reaction products of one or more imidazole compounds and one or more bisepoxides; an electrolyte; one or more accelerators; and one or more suppressors; c) immersing the substrate comprising the layer of photoresist with the plurality of apertures in the copper electroplating bath; and d) electroplating a plurality of copper photoresist defined features in the plurality of apertures, the plurality of photoresist defined features comprise an average % TIR of 5% to 8%.
地址 Marlborough MA US