| 摘要 |
A method and device for measuring a noise figure of a device under test (DUT) (301). The method comprises: acquiring a noise figure of a DUT expansion circuit (300) (200), wherein the DUT expansion circuit (300) comprises a DUT (301) and a DUT path (302), and the DUT path (302) comprises a first impedance matching network (303) disposed at any input port or any output port of the DUT (301); acquiring an insertion loss of the DUT path (302) (201); and acquiring, according to the noise figure of the DUT expansion circuit (300) and the insertion loss of the DUT path (302), a noise figure of the DUT (301) (202). The method and device improve the accuracy of a noise figure measurement result. |
