PHOTONIC-CHANNELED X-RAY DETECTOR ARRAY

摘要

An X-ray detector array includes a scintillator that converts input X-ray radiation to secondary optical radiation output from the scintillator, a first telecentric micro lens array that array receives the secondary optical radiation, a phase coded aperture, where the first telecentric micro lens array directs the secondary optical radiation on the phase coded aperture, a second telecentric micro lens array, where the secondary optical radiation output from the phase coded array is directed to the second telecentric micro lens array, a patterned grating mask, where the second telecentric micro lens array directs the optical beam on the patterned mask, and a photodetector array, where the patterned mask outputs the optical beam in a pattern according to the patterned mask to the photodetector array, where the photodetector array outputs a signal, where a photon fringe pattern is imaged and sampled in the wavelength domain of the radiation from the scintillator.

主权项

1) An X-ray detector array, comprising:
a) a scintillator, wherein said scintillator converts an input X-ray radiation to a secondary optical radiation, wherein said secondary optical radiation is output from said scintillator; b) a first telecentric micro lens array wherein said telecentric micro lens array receives said secondary optical radiation; c) a phase coded aperture, wherein said first telecentric micro lens array directs said secondary optical radiation on said phase coded aperture; d) a second telecentric micro lens array, wherein said secondary optical radiation output from said phase coded array is directed to said second telecentric micro lens array; e) a patterned grating mask, wherein said second telecentric micro lens array directs said optical beam on said patterned mask; and f) a photodetector array, wherein said patterned mask outputs said optical beam in a pattern according to said patterned mask to said photodetector array, wherein said photodetector array outputs a signal, wherein a photon fringe pattern is imaged and sampled in the wavelength domain of said radiation from said scintillator.