发明名称 FUNCTIONAL METAL OXIDE BASED MICROELECTRONIC DEVICES
摘要 A microelectronic device having a functional metal oxide channel may be fabricated on a microelectronic substrate that can be utilized in very large scale integration, such as a silicon substrate, by forming a buffer transition layer between the microelectronic substrate and the functional metal oxide channel. In one embodiment, the microelectronic device may be a microelectronic transistor with a source structure and a drain structure formed on the buffer transition layer, wherein the source structure and the drain structure abut opposing sides of the functional metal oxide channel and a gate dielectric is disposed between a gate electrode and the functional metal oxide channel. In another embodiment, the microelectronic device may be a two-terminal microelectronic device.
申请公布号 WO2017023253(A1) 申请公布日期 2017.02.09
申请号 WO2015US43166 申请日期 2015.07.31
申请人 INTEL CORPORATION;KARPOV, Elijah V.;MAJHI, Prashant;KOTLYAR, Roza;MUKHERJEE, Niloy;KUO, Charles C.;SHAH, Uday;PILLARISETTY, Ravi;CHAU, Robert S. 发明人 KARPOV, Elijah V.;MAJHI, Prashant;KOTLYAR, Roza;MUKHERJEE, Niloy;KUO, Charles C.;SHAH, Uday;PILLARISETTY, Ravi;CHAU, Robert S.
分类号 H01L29/02 主分类号 H01L29/02
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