| 发明名称 |
PROBE COVER |
| 摘要 |
A probe cover which is to be attached to a socket that is configured to support a plurality of contact probes, includes: a base; two positioning pins which are disposed on the base; and at least one supporting member which is disposed on the base. The two positioning pins and the supporting member are capable of positioning the base in a state where the base is separated from the socket by a predetermined distance, and a mutual separation distance between the two positioning pins is changeable. |
| 申请公布号 |
US2017038412(A1) |
申请公布日期 |
2017.02.09 |
| 申请号 |
US201515302666 |
申请日期 |
2015.03.20 |
| 申请人 |
YOKOWO CO., LTD. |
发明人 |
NAGATA Takahiro;MIYASHITA Yoshiji;MIKI Katsuo;OOKAWARA Kazumi;SAMATA Isao |
| 分类号 |
G01R1/073;H01R33/76;G01R31/28 |
主分类号 |
G01R1/073 |
| 代理机构 |
|
代理人 |
|
| 主权项 |
1. A probe cover which is to be attached to a socket that is configured to support a plurality of contact probes, the prove cover comprising:
a base; two positioning pins which are disposed on the base; and at least one supporting member which is disposed on the base, wherein the two positioning pins and the supporting member are capable of positioning the base in a state where the base is separated from the socket by a predetermined distance, and a mutual separation distance between the two positioning pins is changeable. |
| 地址 |
Kita-ku, Tokyo JP |
