发明名称 X-RAY CT SCANNING AND DUAL-SOURCE CT SYSTEM
摘要 A method is disclosed for x-ray CT scanning with a dual-source system, in which two radiation bundles are each delimited by diaphragms such that these radiation bundles are free of mutual points of intersection at least in the examination object. An embodiment of the invention also relates to a dual source CT system, including a controller configured to control radiation-delimiting diaphragms, which delimit and align the radiation bundles such that these run free of mutual points of intersection at least in the examination object.
申请公布号 US2017035375(A1) 申请公布日期 2017.02.09
申请号 US201615297405 申请日期 2016.10.19
申请人 Siemens Aktiengesellschaft 发明人 ALLMENDINGER Thomas;SUNNEGARDH Johan
分类号 A61B6/00;A61B6/03 主分类号 A61B6/00
代理机构 代理人
主权项 1. A method of X-ray CT scanning of an examination object using two emitter-detector systems arranged at different angles on a shared gantry of a CT system, each of the two emitters including a focal point and each of the two detectors being embodied as a multi-row detector with a scattered radiation grid operating in a two-dimensional manner, the method comprising: selecting an offset and moving at least one emitter-detector system by the offset along a system axis, generating, during the scanning process between each of the respective focal points and an opposing one of the two detectors of each of the two emitter-detector systems, a radiation bundle diverging in two dimensions and acquiring an image for each of the two detectors.
地址 Muenchen DE