发明名称 RADIATION-SENSITIVE RESIN COMPOSITION, RESIST PATTERN-FORMING METHOD, ACID GENERATOR AND COMPOUND
摘要 The present invention provides a radiation-sensitive resin composition that contains a polymer having a structural unit that includes an acid-labile group; and an acid generator, wherein the acid generator includes a compound including a sulfonate anion having SO3−, wherein a hydrogen atom or an electron-donating group bonds to an α carbon atom with respect to SO3−, and an electron-withdrawing group bonds to a β carbon atom with respect to SO3−; and a radiation-degradable onium cation. The compound preferably has a group represented by the following formula (1-1) or (1-2). In the following formulae (1-1) and (1-2), R1 and R2 each independently represent a hydrogen atom or a monovalent electron-donating group. R3 represent a monovalent electron-withdrawing group. R4 represents a hydrogen atom or a monovalent hydrocarbon group.;
申请公布号 US2017038679(A1) 申请公布日期 2017.02.09
申请号 US201615332203 申请日期 2016.10.24
申请人 JSR CORPORATION 发明人 TOMIOKA Hiroshi;KIMOTO Takakazu;ASANO Yusuke
分类号 G03F7/004;G03F7/20;G03F7/32;G03F7/40;G03F7/039;C07C321/28;C07D307/00;C07C309/13;C07C309/39;G03F7/16;C07C309/12 主分类号 G03F7/004
代理机构 代理人
主权项
地址 Tokyo JP