发明名称 |
METHOD FOR FORMING FIELD EFFECT TRANSISTORS |
摘要 |
A method for forming field effect transistors comprises forming a first dummy gate stack over a first fin, forming a second dummy gate stack over a second fin, depositing a first layer of spacer material on the first dummy gate stack, the first fin, the second dummy gate stack, and the second fin, patterning a first masking layer on the first dummy gate stack and the first fin, etching to remove portions of the first layer of spacer material and form a spacer adjacent to the second dummy gate stack, removing the first masking layer, epitaxially growing a silicon material on the second fin, depositing a layer of oxide material on the first layer of spacer material, the first epitaxial material and the second dummy gate stack, and depositing a second layer of spacer material on the layer of oxide material. |
申请公布号 |
US2017040224(A1) |
申请公布日期 |
2017.02.09 |
申请号 |
US201615252586 |
申请日期 |
2016.08.31 |
申请人 |
International Business Machines Corporation ;GlobalFoundries, Inc. |
发明人 |
Kambhampati Rama;Wang Junli;Xie Ruilong;Yamashita Tenko |
分类号 |
H01L21/8238;H01L29/66 |
主分类号 |
H01L21/8238 |
代理机构 |
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代理人 |
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主权项 |
1. A method for forming field effect transistors, the method comprising:
forming a first dummy gate stack over a first fin; forming a second dummy gate stack over a second fin; depositing a first layer of spacer material on the first dummy gate stack, the first fin, the second dummy gate stack, and the second fin; patterning a first masking layer on the first dummy gate stack and the first fin; etching to remove portions of the first layer of spacer material and form a spacer adjacent to the second dummy gate stack; removing the first masking layer; epitaxially growing a silicon material on the second fin; depositing a layer of oxide material on the first layer of spacer material, the silicon material and the second dummy gate stack; depositing a second layer of spacer material on the layer of oxide material; patterning a second masking layer over the second dummy gate stack and the second fin; removing exposed portions of the second layer of spacer material; removing exposed portions of the layer of oxide material; etching to remove portions of the first layer of spacer material and form a spacer adjacent to the first dummy gate stack; removing the second masking material; epitaxially growing a silicon material on the second fin; patterning a third masking layer on the first dummy gate stack and the first fin; removing exposed portions of the second layer of spacer material; and removing the third masking layer. |
地址 |
Armonk NY US |