| 发明名称 |
DIE ABNORMALITY PREDICTION SYSTEM, PRESS MACHINE PROVIDED WITH THE SAME, AND DIE ABNORMALITY PREDICTION METHOD |
| 摘要 |
Provided is an abnormality prediction system and an abnormality prediction method that are capable of predicting an abnormality occurring in a die that is used in a press machine. A die abnormality prediction system (50) includes: an acoustic emission (AE) sensor (62) configured to detect an elastic wave that occurs in a processing portion of a die during processing performed by a press machine using the die; a stamping load detection sensor (61) configured to detect a parameter (a stamping load) other than a parameter regarding the elastic wave, out of parameters regarding a state of the die during the processing performed by the press machine using the die; a score calculation unit (56) configured to calculate an abnormality prediction score of the die based on an output signal from the AE sensor (62) and an output signal from the stamping load detection sensor (61); and an abnormality prediction unit (57) configured to predict an abnormality occurring in the die, based on a result of the calculation performed by the score calculation unit (56). |
| 申请公布号 |
US2017036261(A1) |
申请公布日期 |
2017.02.09 |
| 申请号 |
US201615204062 |
申请日期 |
2016.07.07 |
| 申请人 |
Nidec-Shimpo Corporation ;Nidec Corporation |
发明人 |
IWAKURO Tetsuya;SAWADA Takayuki;OTANI Masayuki;KOGA Kazuyoshi;MAEDA Takafumi;HONDA Takeshi;KITA Nobuyuki |
| 分类号 |
B21D55/00;B21D22/02;G01N29/44;G01L5/00;G01N29/14;G01N29/04 |
主分类号 |
B21D55/00 |
| 代理机构 |
|
代理人 |
|
| 主权项 |
1. A die abnormality prediction system for predicting an abnormality in a die that is used in a press machine, comprising:
an acoustic emission (AE) sensor configured to detect an elastic wave that occurs in a processing portion of the die during stamping performed by the press machine using the die; a stamping state detection unit configured to detect a parameter other than a parameter regarding the elastic wave, out of parameters regarding a state of the die during the stamping performed by the press machine using the die; a score calculation unit configured to calculate an abnormality prediction score of the die based on an output signal from the AE sensor and an output signal from the stamping state detection unit; and an abnormality prediction unit configured to predict an abnormality occurring in the die, based on a result of the calculation performed by the score calculation unit. |
| 地址 |
Nagaokakyo-shi JP |
