发明名称 PLASMA TREATMENT DEVICE AND COIL USED THEREIN
摘要 A plasma etching apparatus includes a chamber having a processing space and a plasma generating space 4 defined therein and a coil 20 wound around the processing chamber, the coil 20 has at least three inward projecting portions 21 formed thereon which project inward in a radial direction with respect to a pitch circle P defined outside a portion of the processing chamber 2 corresponding to the plasma generating space 4, and the at least three inward projecting portions 21 are arranged at equal intervals along a circumferential direction of the pitch circle P.
申请公布号 EP3128819(A1) 申请公布日期 2017.02.08
申请号 EP20140887912 申请日期 2014.03.31
申请人 SPP Technologies Co., Ltd. 发明人 HAYAMI, Toshihiro;MIYAZAKI, Toshiya
分类号 H05H1/46;H01L21/205;H01L21/3065 主分类号 H05H1/46
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