| 摘要 |
Apparatus 30 for locating a remote point of interest, with the apparatus 30 comprising means for providing a baseline, means for measuring angles and means for measuring position. The baseline providing means 31 provides a reference baseline between its own position and a remote, visible, mensurated position. The angle measuring means 46 features multi-axis microelectromechanical systems (MEMS) which measure delta angles to the remote point of interest, with the delta angles being generated through slewing between the reference baseline and the remote object of interest. The position measuring means 37 measures the position of the baseline providing means 31. The device is non-static, with motion in its own position compensated for by the multi-axis MEMS angle measuring means 46, and potential motion in the remote, visible, mensurated position is compensated for by the periodic transmission of correction data. |
