发明名称 Three-dimensional semiconductor memory devices and methods of fabricating the same
摘要 Three-dimensional semiconductor memory devices and methods of fabricating the same. The three-dimensional semiconductor devices include an electrode structure with sequentially-stacked electrodes disposed on a substrate, semiconductor patterns penetrating the electrode structure, and memory elements including a first pattern and a second pattern interposed between the semiconductor patterns and the electrode structure, the first pattern vertically extending to cross the electrodes and the second pattern horizontally extending to cross the semiconductor patterns.
申请公布号 US9564499(B2) 申请公布日期 2017.02.07
申请号 US201313972533 申请日期 2013.08.21
申请人 Samsung Electronics Co., Ltd. 发明人 Seol Kwang-Soo;Park Chanjin;Hwang Ki-Hyun;Choi Hanmei;Hur Sunghoi;Hwang Wansik;Nakanishi Toshiro;Park Kwangmin;Lee Ju-Yul
分类号 H01L29/423;H01L21/3213;H01L27/06;H01L27/115;H01L29/792;H01L29/51 主分类号 H01L29/423
代理机构 Myers Bigel, P.A. 代理人 Myers Bigel, P.A.
主权项 1. A semiconductor memory device comprising: a semiconductor structure extending in a first direction; an electrode on the semiconductor structure, the electrode extending in a second direction that is perpendicular to the first direction; an insulating layer on the semiconductor structure, the insulating layer on the electrode and extending in the second direction; and a tunneling layer, a charge storage layer, a capping layer, and a blocking layer, respectively between the semiconductor structure and the electrode, the blocking layer between the electrode and the capping layer,the capping layer extending a first length in the first direction along a side surface of the insulating layer,the blocking layer extending a second length in the first direction, andthe first length is larger than the second length.
地址 KR