发明名称 Specular object scanner for measuring reflectance properties of objects
摘要 An apparatus to measure surface orientation maps of an object may include a light source that is configured to illuminate the object with a controllable field of illumination. One or more cameras may be configured to capture at least one image of the object. A processor may be configured to process the image(s) to extract the reflectance properties of the object including an albedo, a reflection vector, a roughness, and/or anisotropy parameters of a specular reflectance lobe associated with the object. The controllable field of illumination may include limited-order Spherical Harmonics (SH) and Fourier Series (FS) illumination patterns with substantially similar polarization. The SH and FS illumination patterns are used with different light sources.
申请公布号 US9562857(B2) 申请公布日期 2017.02.07
申请号 US201414212751 申请日期 2014.03.14
申请人 UNIVERSITY OF SOUTHERN CALIFORNIA 发明人 Debevec Paul E.;Yu Xueming;Fyffe Graham Leslie;Ghosh Abhijeet
分类号 G01N21/55;G01B11/30;G01B11/25 主分类号 G01N21/55
代理机构 McDermott Will & Emery LLP 代理人 McDermott Will & Emery LLP
主权项 1. An apparatus to measure surface orientation maps of an object, the apparatus comprising: a light source configured to illuminate the object with a controllable field of illumination; one or more driver circuits configured to drive the light source with modulated signals to generate the controllable field of illumination; and a processor configured to generate control signals to control the one or more driver circuits to cause the one or more driver circuits to drive the light source with the modulated signals, wherein the controllable field of illumination comprises limited-order spherical Harmonics (SH) or Fourier Series (FS) illumination patterns, wherein different light sources produce the SH illumination patterns and the FS illumination patterns.
地址 Los Angeles CA US
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