发明名称 Method for determining layer direction of conductor layers in a multilayer electronic component
摘要 A layer direction determining method for a multilayer electronic component to accurately determine the layer direction of conductor layers in the multilayer electronic component.
申请公布号 US9562863(B2) 申请公布日期 2017.02.07
申请号 US201314145211 申请日期 2013.12.31
申请人 Murata Manufacturing Co., Ltd. 发明人 Okamura Kouki
分类号 G01N21/84;B65G15/04;G01N29/24;B65B15/04;H05K13/02;H05K13/08;G01J5/10;C23C28/00 主分类号 G01N21/84
代理机构 Studebaker & Brackett PC 代理人 Studebaker & Brackett PC
主权项 1. A layer direction determining method for a multilayer electronic component, the layer direction determining method comprising: measuring a value of an amount of infrared energy detected from an area including an observation face where a multilayer electronic component in which conductor layers and nonconductor layers are layered is observed under a measurement condition that is set in advance; determining a threshold value corresponding to the measurement condition; comparing the threshold value with the measured value of the detected amount of infrared energy; and determining a layer direction of the conductor layers in the multilayer electronic component on the basis of the result of the comparison of the threshold value with the measured value of the detected amount of infrared energy.
地址 Kyoto-fu JP