Methods and systems of electromagnetic interferometry for downhole environments

摘要

A disclosed electromagnetic (EM) interferometry system includes a first EM field sensor at a first position in a downhole environment. The system also includes a second EM field sensor at a second position in the downhole environment. The system also includes a processing unit that receives a first EM field measurement from the first EM field sensor and a second EM field measurement from the second EM field sensor. The processing unit derives a response of the first EM field sensor to a virtual EM field source at the second position by cross-correlating the first EM field measurement with the second EM field measurement. The processing unit also performs an inversion process based at least in part on the derived response to obtain a model of subsurface formation properties.

主权项

1. An electromagnetic interferometry system, comprising:
a first electromagnetic field sensor at a first position in a downhole environment; and a second electromagnetic field sensor at a second position in the downhole environment; a processing unit that receives a first electromagnetic field measurement from the first electromagnetic field sensor and a second electromagnetic field measurement from the second electromagnetic field sensor, wherein the processing unit derives a response of the first electromagnetic field sensor to a virtual electromagnetic field source at the second position by cross-correlating the first electromagnetic field measurement with the second electromagnetic field measurement, and wherein the processing unit performs an inversion process based at least in part on the derived response to obtain a model of subsurface formation properties.