发明名称 |
In-plane copper imbalance for warpage prediction |
摘要 |
A method of predicting warpage of a laminate is disclosed in which in-plane copper imbalance is calculated. A method of designing an organic build-up laminate is provided in which in-plane copper imbalance is calculated and imbalances are corrected. |
申请公布号 |
US9563732(B1) |
申请公布日期 |
2017.02.07 |
申请号 |
US201615006567 |
申请日期 |
2016.01.26 |
申请人 |
INTERNATIONAL BUSINESS MACHINES CORPORATION |
发明人 |
Call Anson J.;Khanna Vijayeshwar D.;Russell David J.;Tunga Krishna R. |
分类号 |
G06F17/50;H05K3/00 |
主分类号 |
G06F17/50 |
代理机构 |
Cantor Colburn LLP |
代理人 |
Cantor Colburn LLP ;Meyers Steven |
主权项 |
1. A method of designing an organic build-up laminate comprising:
substantially completing a laminate design; calculating a copper imbalance, wherein calculating the copper imbalance is based on an in-plane copper imbalance and the out of plane copper imbalance; predicting a laminate warpage based on the copper imbalance; modifying the design by adding or removing copper from select areas to reduce the copper imbalance; recalculating the copper imbalance; and predicting the laminate warpage based on the recalculated copper imbalance, wherein an in-plane copper resistance is calculated for each layer separately using the following Equation 2:CuInplaneImbalanceforalayer=4(%Cuchip-%Cufanout)Ac/Af(1+Ac/Af)2Equation2 then, the in-plane copper imbalance between the layer pair is calculated, using Equation 3:
CuIn-plane Imbalance between Layers=(CuFCxInplane Imbalance−CuBCxInplane Imbalance) Equation 3 |
地址 |
Armonk NY US |