主权项 |
1. A method of forming a semiconductor structure, said method comprising:
providing a fin structure comprising, from bottom to top, a silicon material fin portion, a silicon germanium alloy fin portion having a first germanium content and a first width, and a hard mask material fin portion and located on a first portion of a substrate, and a pre-pad structure comprising, from bottom to top, a silicon material portion, a silicon germanium alloy material portion having said first germanium content, and a hard mask material portion and located on a second portion of a substrate; and performing a condensation oxidation to convert both of said silicon material fin portion and said silicon germanium alloy fin portion into a silicon germanium alloy fin having a second germanium content and a second width, wherein said second germanium content is greater than said first germanium content and wherein said second width is less than said first width, while simultaneously converting said silicon material portion and said silicon germanium alloy material portion having said first germanium content into a laterally graded silicon germanium alloy material portion. |