| 发明名称 |
SEMICONDUCTOR MEMORY APPARATUS AND TEST METHOD THEREOF |
| 摘要 |
A semiconductor memory apparatus includes a normal write pulse generator configured to generate a normal write pulse in a normal operation, a test write pulse generator configured to repeatedly generate a test write pulse a preset number of times in a test operation, and a selector configured to provide the normal write pulse to a memory cell in the normal operation and provide the test write pulse to the memory cell in the test operation. |
| 申请公布号 |
US2017032850(A1) |
申请公布日期 |
2017.02.02 |
| 申请号 |
US201615049900 |
申请日期 |
2016.02.22 |
| 申请人 |
SK hynix Inc. |
发明人 |
LIM Seung Kyun;EM Ho Seok |
| 分类号 |
G11C29/38;G11C29/44;G11C13/00 |
主分类号 |
G11C29/38 |
| 代理机构 |
|
代理人 |
|
| 主权项 |
1. A semiconductor memory apparatus comprising:
a normal write pulse generator configured to generate a normal write pulse in a normal operation; a test write pulse generator configured to repeatedly generate a test write pulse a preset number of times in a test operation; and a selector configured to provide the normal write pulse to a memory cell in the normal operation and provide the test write pulse to the memory cell in the test operation. |
| 地址 |
Icheon-si Gyeonggi-do KR |
