发明名称 RUBBER CRUMB INSPECTION SYSTEM
摘要 An inspection system for inspecting rubber crumb includes a conveyor, lighting, a camera, and a controller. The conveyor is used to carry the rubber crumb. The lighting is positioned above the conveyor to illuminate the rubber crumb with at least 3,500 lumens. The camera is positioned adjacent to the lighting to take images of the illuminated rubber crumb in the lighted area. The controller receives the images from the camera and detects a contamination in the rubber crumb by determining whether there is a dark particle within the crumb. If a contamination is detected, it may be removed from the remaining rubber crumb.
申请公布号 US2017030838(A1) 申请公布日期 2017.02.02
申请号 US201615222275 申请日期 2016.07.28
申请人 Zeon Chemicals L.P. 发明人 McDonald David J.;Allen Mark
分类号 G01N21/88;G01N21/27;B07C5/342;G01N21/94 主分类号 G01N21/88
代理机构 代理人
主权项 1. An inspection system for inspecting rubber crumb comprising: (a) a conveyor configured to carry the rubber crumb; (b) lighting positioned above the conveyor such that the lighting is configured to illuminate the rubber crumb with at least 3,500 lumens; (c) a camera positioned above the conveyor adjacent to the lighting, wherein the camera is configured to take images of the rubber crumb in the lighted area; and (d) a controller in communication with the camera such that the controller is configured to receive the images from the camera, wherein the controller is configured to detect a contamination within the rubber crumb by detecting a contamination particle that is darker than the rubber crumb and the conveyor.
地址 Louisville KY US