发明名称 WAFER PROCESSING METHOD
摘要 Disclosed herein is a wafer processing method in which laser processing is carried out on a wafer along streets. The wafer processing method includes a step of holding the wafer by a chuck table, a protective film forming step of forming a water-soluble protective film on a surface of the wafer, a laser beam irradiating step of irradiating the wafer with a laser beam along the streets after the protective film forming step, a step of supplying a chemical having an amino group to the wafer, and a removing step of cleaning and removing a compound that is generated by the supplying of the chemical having an amino group and contains phosphorus.
申请公布号 US2017032985(A1) 申请公布日期 2017.02.02
申请号 US201615219499 申请日期 2016.07.26
申请人 DISCO CORPORATION 发明人 Ryo Senichi;Matsumoto Hirokazu;Yoshikawa Toshiyuki;Ohura Yukinobu
分类号 H01L21/67;B23K26/18;B23K26/402;H01L29/20;B23K26/364 主分类号 H01L21/67
代理机构 代理人
主权项 1. A wafer processing method in which a wafer in which devices are formed in a plurality of regions marked out by a plurality of streets formed in a lattice manner on a surface of a substrate composed of a phosphorus compound and metal electrodes are formed over the surface is subjected to laser processing along the streets, the wafer processing method comprising: a step of holding the wafer by a chuck table; a protective film forming step of forming a water-soluble protective film on a surface of the wafer; a laser beam irradiating step of irradiating the wafer with a laser beam along the streets after the protective film forming step; a step of supplying a chemical having an amino group to the wafer; and a removing step of cleaning and removing a compound that is generated on the wafer by the supplying of the chemical and contains phosphorus.
地址 Tokyo JP