| 摘要 |
PROBLEM TO BE SOLVED: To acquire a highly accurate measurement result.SOLUTION: A measurement device comprises: a signal process part 2 that generates data D1v and D1a on the basis of an input signal; a pre process part 3 that has a correction process part 3b correcting the data D1v and D1a on the basis of correction data Drv and Dra, and generating data D2v and D2a and a computation process part 3c generating data D3v and D3a on the basis of data D2v and D2a; and a main process part 7 that generates data D4v and D4a on the basis of data D3v and D3a, and outputs the data D4v and D4a as a measurement result. The main process part 7 generates data Drv and Dra on a value including a value of a N digit lower than the lowest order digit in values of the data D1v and D1a, and generates data D4v and D4a on a value in which the digit in the lowest order is equal to the digit in the lowest order in values of the data Drv and Dra, and the correction process part 3b generates data D2v and D2a on a value in which the digit in the lowest order is equal to the digit in the lowest order in values of the data Drv and Dra. |
