| 摘要 |
A pattern extracting device, an image projecting device, a pattern extracting method, and a program capable of extracting all the feature points by interpolating defective feature points even when there are defective feature points of an image pattern. The pattern extracting device extracts feature points to be interpolated based on a captured image of a projected image pattern, and interpolates the feature point to be interpolated by using near-by feature points that are located near the feature point, divides the near-by feature points into groups, calculates extrapolation coordinates of the groups, and calculates coordinates of the feature point to be interpolated in view of significance of the extrapolation. |
